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Title: The Dutch xAPI Experience
Authors: Berg, Alan
Scheffel, Maren
Drachsler, Hendrik
Ternier, Stefaan
Specht, Marcus
Keywords: learning analytics
learning record store
data standardization
data silos
Issue Date: 2016
Publisher: ACM
Citation: Berg, A., Scheffel, M., Drachsler, H., Ternier, S., & Specht, M. (2016). The Dutch xAPI experience. In Proceedings of the Sixth International Conference on Learning Analytics and Knowledge (LAK’16) (pp. 544–545). New York, NY, USA: ACM. doi: 10.1145/2883851.2883968
Abstract: We present the collected experiences since 2012 of the Dutch Special Interest Group (SIG) for Learning Analytics in the application of the xAPI standard. We have been experimenting and exchanging best practices around the application of xAPI in various contexts. The practices include di fferent design patterns centered around Learning Record Stores. We present three projects that apply xAPI in very diff erent ways and publish a consistent set of xAPI recipes.
Appears in Collections:1. TELI Publications, books and conference papers

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